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CRX-66非接觸或在線顏色測量儀器
CRX-66非接觸或在線顏色測量儀器
CRX-66非接觸或在線顏色測量儀器
CRX-66非接觸或在線顏色測量儀器
CRX-66非接觸或在線顏色測量儀器
CRX-66非接觸或在線顏色測量儀器
CRX-66非接觸或在線顏色測量儀器

CRX-66非接觸或在線顏色測量儀器

最小訂單:1 Piece/Pieces
港口:Contact salesperson to confirm

  • 產品内容
  • 包裝和交付
  • 產品描述
  • 供應能力和附加資訊
產品内容

手機號CRX-66

ModelCRX-66

Range400-700nm

FunctionCan quickly and accurately measure the color of an object's surface through non-contact methods, without contaminating or damaging the sample; It can also be installed on assembly lines and robotic arms.

CaliberΦ8mm/Φ21mm

Measurement StabilitydE*ab≤0.02

Support APPNo

Support PC SoftwareNo

應用區域它可以安裝在裝配線和機器人臂上,以實時監視產品的顏色,向後傳輸數據並提供及時的產品質量反饋。

Size230x160x150mm

Weight2.7kg

包裝和交付
銷售組織: Piece/Pieces
套裝程式類型: 聯繫銷售人員確認

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產品描述

CHNSPEC CRX-66非接觸式或在線顏色測量儀器,用於陽極氧化顏色產品

非接觸分光光度計是一種高精度的顏色測量儀器,可以通過非接觸方式快速而準確地測量物體表面的顏色,而不會對樣品污染或損壞;它也可以安裝在裝配線和機械臂上,以實時監視產品的顏色,返回數據並及時提供產品質量的反饋。
產品功能可以測量多種顏色指標
*防水和防塵,保護類IP66
*標準配備強大的PC數據管理軟件
*使用LED燈光來壽命更長
*支持內部校準以確保高儀器穩定性
*雙光路譜的顏色測量方法具有高速,高精度和良好重複性的優勢
*支持RS232,RS485,USB,網絡端口,模擬信號各種通信模式

CHNSPEC CRX-66非接觸式或在線顏色測量儀器,用於陽極氧化顏色產品
Model CRX-60 CRX-62 CRX-66
Geometry* 45/0
Repeatability** dE*ab≤0.1 dE*ab≤0.05 dE*ab≤0.02
Inter-instrument agreement*** / / dE*ab≤0.25
Display accuracy 0.01
Measuring/Lighting calibers Φ8mm/Φ21mm
Measurement index CIE-Lab,XYZ
Light source condition,
CIE-Lab,CIE-LCh,HunterLab,CIE-Luv,XYZ,Yxy,
RGB,chromatic aberration(ΔE*ab,ΔE*cmc,ΔE*94,ΔE*00),whiteness(ASTM
E313-00,ASTM E313-73,CIE,ISO2470/R457,AATCC,
Hunter,Taube Berger Stensby),yellowness(ASTM D1925,
ASTM E313-00,ASTM E313-73),blackeness(My,dM),
color fastness,color fastness,Tint(ASTM E313-00),
color densityCMYK(A,T,E,M)
Light source condition A,C,D65
A,B,C,D50,D55,D65,D75,F1,F2,F3,F4,F5,F6,F7,F8,
F9,F10,F11,F12,CWF,U30,U35,DLF,NBF,TL83,TL84,
ID50,ID65,LED-B1,LED-B2,LED-B3,LED-B4,LED-B5,
LED-BH1,LED-RGB1,LED-V1, LED-V2
Lighting source Full band balancedLED light source
Field angle 2°,10°
Meet a criterion CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7
Spectroscopic method Nanobeam splitting device Raster
SenSor Silicon optical array device Dual-row high-precisionCMOS array sensor
Wavelength interval 10nm
Wavelength coverage 400-700nm
Reflectance measurement range 0-200%
Reflectance resolution 0.01%
Measurement and observation mode Visual
Calibration Intelligent automatic calibration
Accuracy guarantee Ensure the first level of measurement
Measuring time Single measurement 110ms Single measurement50ms
Measuring interval 1s
Port USB,485,232,External trigger, analog output, Ethernet
Screen No Full color screen,3.5 inches
Light source lifetime 1 million times in 10 years
Language / Simplified Chinese, English
Non-contact distance 5mm
供應能力和附加資訊

包裝聯繫銷售人員確認

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港口Contact salesperson to confirm

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